@misc{indiciaed0a04d435168,
  title = {Interplay between O defects and SiC stacking at the SiC/SiO\$\_2\$ interface},
  author = {Christopher James Kirkham and Tomoya Ono},
  year = {2015},
  url = {https://arxiv.org/abs/1508.01590},
  note = {Source identifier: 1508.01590}
}