TY  - RPRT
TI  - Interplay between O defects and SiC stacking at the SiC/SiO$_2$ interface
AU  - Christopher James Kirkham
AU  - Tomoya Ono
PY  - 2015
UR  - https://arxiv.org/abs/1508.01590
ID  - 1508.01590
ER  -