@misc{indiciae3f1559928cfd,
  title = {Spitzer Microlens Measurement of a Massive Remnant in a Well-Separated Binary},
  author = {Y. Shvartzvald and A. Udalski and A. Gould and C. Han and V. Bozza and M. Friedmann and M. Hundertmark and C. Beichman and G. Bryden and S. Calchi Novati and S. Carey and M. Fausnaugh and B. S. Gaudi and C. B. Henderson and T. Kerr and R. W. Pogge and W. Varricatt and B. Wibking and J. C. Yee and W. Zhu and R. Poleski and M. Pawlak and M. K. Szymański and J. Skowron and P. Mróz and S. Kozłowski and Ł. Wyrzykowski and P. Pietrukowicz and G. Pietrzyński and I. Soszyński and K. Ulaczyk and J. -Y. Choi and H. Park and Y. K. Jung and I. -G. Shin and M. D. Albrow and B. -G. Park and S. -L. Kim and C. -U. Lee and S. -M. Cha and D. -J. Kim and Y. Lee and D. Maoz and S. Kaspi and R. A. Street and Y. Tsapras and E. Bachelet and M. Dominik and D. M. Bramich and Keith Horne and C. Snodgrass and I. A. Steele and J. Menzies and R. Figuera Jaimes and J. Wambsganss and R. Schmidt and A. Cassan and C. Ranc and S. Mao and Subo Dong and G. D'Ago and G. Scarpetta and P. Verma and U. G. Jørgensen and E. Kerins and J. Skottfelt},
  year = {2015},
  doi = {10.1088/0004-637x/814/2/111},
  url = {https://arxiv.org/abs/1508.06636},
  note = {Source identifier: 1508.06636}
}