@misc{indiciae980611a79c87,
  title = {In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory},
  author = {B. L. Ji and H. Li and Q. Ye and S. Gausepohl and S. Deora and D. Veksler and S. Vivekanand and H. Chong and H. Stamper and T. Burroughs and C. Johnson and M. Smalley and S. Bennett and V. Kaushik and J. Piccirillo and M. Rodgers and M. Passaro and M. Liehr},
  year = {2015},
  doi = {10.1109/imw.2015.7150290},
  url = {https://arxiv.org/abs/1509.00070},
  note = {Source identifier: 1509.00070}
}