@misc{indiciaee007c38b77d7,
  title = {Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results},
  author = {D. Spiga and A. Mirone and G. Pareschi and R. Canestrari and V. Cotroneo and C. Ferrari and C. Ferrero and L. Lazzarini and D. Vernani},
  year = {2015},
  doi = {10.1117/12.672895},
  url = {https://arxiv.org/abs/1509.02264},
  note = {Source identifier: 1509.02264}
}