TY  - RPRT
TI  - Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results
AU  - D. Spiga
AU  - A. Mirone
AU  - G. Pareschi
AU  - R. Canestrari
AU  - V. Cotroneo
AU  - C. Ferrari
AU  - C. Ferrero
AU  - L. Lazzarini
AU  - D. Vernani
PY  - 2015
DO  - 10.1117/12.672895
UR  - https://arxiv.org/abs/1509.02264
ID  - 1509.02264
ER  -