TY  - RPRT
TI  - HEW simulations and quantification of the microroughness requirements for X-ray telescopes by means of numerical and analytical methods
AU  - D. Spiga
AU  - G. Cusumano
AU  - G. Pareschi
PY  - 2015
DO  - 10.1117/12.734814
UR  - https://arxiv.org/abs/1509.02732
ID  - 1509.02732
ER  -