TY  - RPRT
TI  - Precision measurement of the carrier drift velocities in <100> silicon
AU  - C. Scharf
AU  - R. Klanner
PY  - 2015
DO  - 10.1088/1748-0221/10/11/c11008
UR  - https://arxiv.org/abs/1509.04183
ID  - 1509.04183
ER  -