TY  - RPRT
TI  - Analysis of microroughness evolution in X-ray astronomical multilayer mirrors by surface topography with the MPES program and by X-ray scattering
AU  - R. Canestrari
AU  - D. Spiga
AU  - G. Pareschi
PY  - 2015
DO  - 10.1117/12.671861
UR  - https://arxiv.org/abs/1509.04769
ID  - 1509.04769
ER  -