TY  - RPRT
TI  - Curvature-controlled defect localization in crystalline wrinkling patterns
AU  - Francisco López Jiménez
AU  - Norbert Stoop
AU  - Romain Lagrange
AU  - Jörn Dunkel
AU  - Pedro M. Reis
PY  - 2015
UR  - https://arxiv.org/abs/1509.06547
ID  - 1509.06547
ER  -