TY  - RPRT
TI  - Measurement of lateral and interfacial thermal conductivity of single- and bi-layer MoS2 and MoSe2 using refined optothermal Raman technique
AU  - Xian Zhang
AU  - Dezheng Sun
AU  - Yilei Li
AU  - Gwan-Hyoung Lee
AU  - Xu Cui
AU  - Daniel Chenet
AU  - Yumeng You
AU  - Tony Heinz
AU  - James Hone
PY  - 2015
UR  - https://arxiv.org/abs/1509.07100
ID  - 1509.07100
ER  -