TY  - RPRT
TI  - Stability of low-carrier-density topological-insulator Bi$_2$Se$_3$ thin films and effect of capping layers
AU  - Maryam Salehi
AU  - Matthew Brahlek
AU  - Nikesh Koirala
AU  - Jisoo Moon
AU  - Liang Wu
AU  - N. P. Armitage
AU  - Seongshik Oh
PY  - 2015
DO  - 10.1063/1.4931767
UR  - https://arxiv.org/abs/1510.01804
ID  - 1510.01804
ER  -