@misc{indiciae924430598298,
  title = {Reliable determination of the Cu/n-Si Schottky barrier height by using in-device hot-electron spectroscopy},
  author = {Subir Parui and Ainhoa Atxabal and Mário Ribeiro and Amilcar Bedoya-Pinto and Xiangnan Sun and Roger Llopis and Fèlix Casanova and Luis E. Hueso},
  year = {2015},
  doi = {10.1063/1.4934885},
  url = {https://arxiv.org/abs/1510.06854},
  note = {Source identifier: 1510.06854}
}