TY  - RPRT
TI  - Characterization of Micro-Roughness Parameters and Optical Properties of Obliquely Deposited HfO2 Thin Films
AU  - R B Tokas
AU  - S Jena
AU  - P Sarkar
AU  - S Thakur
AU  - N K Sahoo
PY  - 2015
UR  - https://arxiv.org/abs/1510.07378
ID  - 1510.07378
ER  -