@misc{indiciae458cb9dab416,
  title = {Using atom probe tomography to understand Schottky barrier height pinning at the ZnO:Al / SiO2 / Si interface},
  author = {R. Jaramillo and Amanda Youssef and Austin Akey and Frank Schoofs and Shriram Ramanathan and Tonio Buonassisi},
  year = {2015},
  doi = {10.1103/physrevapplied.6.034016},
  url = {https://arxiv.org/abs/1510.08794},
  note = {Source identifier: 1510.08794}
}