TY  - RPRT
TI  - Using atom probe tomography to understand Schottky barrier height pinning at the ZnO:Al / SiO2 / Si interface
AU  - R. Jaramillo
AU  - Amanda Youssef
AU  - Austin Akey
AU  - Frank Schoofs
AU  - Shriram Ramanathan
AU  - Tonio Buonassisi
PY  - 2015
DO  - 10.1103/physrevapplied.6.034016
UR  - https://arxiv.org/abs/1510.08794
ID  - 1510.08794
ER  -