TY  - RPRT
TI  - Effect of interface geometry on electron tunnelling in Al/Al$_2$O$_3$/Al junctions
AU  - M Koberidze
AU  - A V Feshchenko
AU  - M J Puska
AU  - R M Nieminen
AU  - J P Pekola
PY  - 2015
DO  - 10.1088/0022-3727/49/16/165303
UR  - https://arxiv.org/abs/1511.08636
ID  - 1511.08636
ER  -