TY  - RPRT
TI  - Ellipsometry studies of Si/Ge superlattices with embedded Ge dots
AU  - Seref Kalem
AU  - Orjan Arthursson
AU  - Peter Werner
PY  - 2015
DO  - 10.1007/s00339-013-7781-5
UR  - https://arxiv.org/abs/1512.07994
ID  - 1512.07994
ER  -