TY  - RPRT
TI  - Optical characterization of dislocation free Ge and GeOI wafers
AU  - S. Kalem
AU  - I. Romandic
AU  - A. Theuwis
PY  - 2015
DO  - 10.1016/j.tsf.2009.09.137
UR  - https://arxiv.org/abs/1512.08005
ID  - 1512.08005
ER  -