TY  - RPRT
TI  - Structured Back Gates for High-Mobility Two-Dimensional Electron Systems Using Oxygen Ion Implantation
AU  - Matthias Berl
AU  - Lars Tiemann
AU  - Werner Dietsche
AU  - Helmut Karl
AU  - Werner Wegscheider
PY  - 2016
DO  - 10.1063/1.4945090
UR  - https://arxiv.org/abs/1601.01889
ID  - 1601.01889
ER  -