TY  - RPRT
TI  - Sn-loss effect in a Sn-implanted a-SiO2 host-matrix after thermal annealing: A combined XPS, PL, and DFT study
AU  - D. A. Zatsepin
AU  - A. F. Zatsepin
AU  - D. W. Boukhvalov
AU  - E. Z. Kurmaev
AU  - N. V. Gavrilov
PY  - 2016
DO  - 10.1016/j.apsusc.2016.01.126
UR  - https://arxiv.org/abs/1601.03802
ID  - 1601.03802
ER  -