TY  - RPRT
TI  - Analysis of electronic and structural properties of surfaces and interfaces based on LaAlO3 and SrTiO3
AU  - I. I. Piyanzina
AU  - Yu. V. Lysogorskiy
AU  - I. I. Varlamova
AU  - A. G. Kiiamov
AU  - T. Kopp
AU  - V. Eyert
AU  - O. V. Nedopekin
AU  - D. A. Tayurskii
PY  - 2016
DO  - 10.1007/s10909-016-1483-2
UR  - https://arxiv.org/abs/1601.04009
ID  - 1601.04009
ER  -