TY  - RPRT
TI  - Duality between erasures and defects
AU  - Yongjune Kim
AU  - B. V. K. Vijaya Kumar
PY  - 2016
DO  - 10.1109/ita.2016.7888148
UR  - https://arxiv.org/abs/1602.03536
ID  - 1602.03536
ER  -