TY  - RPRT
TI  - Influence of the substrate material on the knife-edge based profiling of tightly focused light beams
AU  - C. Huber
AU  - S. Orlov
AU  - P. Banzer
AU  - G. Leuchs
PY  - 2016
DO  - 10.1364/oe.24.008214
UR  - https://arxiv.org/abs/1602.04992
ID  - 1602.04992
ER  -