TY  - RPRT
TI  - Determining layer number of two dimensional flakes of transition-metal dichalcogenides by the Raman intensity from substrate
AU  - Xiao-Li Li
AU  - Xiao-Fen Qiao
AU  - Wen-Peng Han
AU  - Xin Zhang
AU  - Qing-Hai Tan
AU  - Tao Chen
AU  - Ping-Heng Tan
PY  - 2016
DO  - 10.1088/0957-4484/27/14/145704
UR  - https://arxiv.org/abs/1602.05378
ID  - 1602.05378
ER  -