TY  - RPRT
TI  - Critical behavior of sputter-deposited magnetoelectric antiferromagnetic Cr$_2$O$_3$ films near Néel temperature
AU  - Muftah Al-Mahdawi
AU  - Yohei Shiokawa
AU  - Satya Prakash Pati
AU  - Shujun Ye
AU  - Tomohiro Nozaki
AU  - Masashi Sahashi
PY  - 2016
DO  - 10.1088/1361-6463/aa623e
UR  - https://arxiv.org/abs/1602.07547
ID  - 1602.07547
ER  -