TY  - RPRT
TI  - Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis
AU  - Veeresh Taranalli
AU  - Hironori Uchikawa
AU  - Paul H. Siegel
PY  - 2016
DO  - 10.1109/tcomm.2016.2584602
UR  - https://arxiv.org/abs/1602.07743
ID  - 1602.07743
ER  -