@misc{indiciae2dceb1787963,
  title = {Investigating the Temperature Effects on Resistive Random Access Memory (RRAM) Devices},
  author = {T. D. Dongale and K. V. Khot and S. V. Mohite and S. S. Khandagale and S. S. Shinde and A. V. Moholkar and K. Y. Rajpure and P. N. Bhosale and P. S. Patil and P. K. Gaikwad and R. K. Kamat},
  year = {2016},
  url = {https://arxiv.org/abs/1602.08262},
  note = {Source identifier: 1602.08262}
}