TY  - RPRT
TI  - Sequential measurement of displacement and conduction currents in electronic devices
AU  - Guillermo Albareda
AU  - Fabio Lorenzo Traversa
AU  - Abdelilah Benali
PY  - 2016
UR  - https://arxiv.org/abs/1602.08278
ID  - 1602.08278
ER  -