TY  - RPRT
TI  - High-pressure melt growth and transport properties of SiP, SiAs, GeP, and GeAs 2D layered semiconductors
AU  - Céline Barreteau
AU  - Baptiste Michon
AU  - Céline Besnard
AU  - Enrico Giannini
PY  - 2016
DO  - 10.1016/j.jcrysgro.2016.03.019
UR  - https://arxiv.org/abs/1603.02134
ID  - 1603.02134
ER  -