@misc{indiciae38ffc6225db5,
  title = {Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow-filtering},
  author = {Samuel Tardif and Alban Gassenq and Kevin Guilloy and Nicolas Pauc and Guilherme Osvaldo Dias and Jean-Michel Hartmann and Julie Widiez and Thomas Zabel and Esteban Marin and Hans Sigg and Jérôme Faist and Alexei Chelnokov and Vincent Reboud and Vincent Calvo and Jean-Sébastien Micha and Odile Robach and François Rieutord},
  year = {2016},
  url = {https://arxiv.org/abs/1603.06370},
  note = {Source identifier: 1603.06370}
}