@misc{indiciae70f58ff11b00,
  title = {Automated Threshold Selection for Extreme Value Analysis via Goodness-of-Fit Tests with Application to Batched Return Level Mapping},
  author = {Brian Bader and Jun Yan and Xuebin Zhang},
  year = {2016},
  doi = {10.1214/17-aoas1092},
  url = {https://arxiv.org/abs/1604.02024},
  note = {Source identifier: 1604.02024}
}