TY  - RPRT
TI  - Quantitative determination of optical and recombination losses in thin-film photovoltaic devices based on external quantum efficiency analysis
AU  - Akihiro Nakane
AU  - Hitoshi Tampo
AU  - Masato Tamakoshi
AU  - Shohei Fujimoto
AU  - Kang Min Kim
AU  - Shinho Kim
AU  - Hajime Shibata
AU  - Shigeru Niki
AU  - Hiroyuki Fujiwara
PY  - 2016
DO  - 10.1063/1.4960698
UR  - https://arxiv.org/abs/1604.04491
ID  - 1604.04491
ER  -