@misc{indiciaeb53847d45751,
  title = {An X-Band Waveguide Measurement Technique for the Accurate Characterization of Materials with Low Dielectric Loss Permittivity},
  author = {Kenneth W. Allen and Mark M. Scott and David R. Reid and Jeffrey A. Bean and Jeremy D. Ellis and Andrew P. Morris and Jeramy M. Marsh},
  year = {2016},
  doi = {10.1063/1.4948388},
  url = {https://arxiv.org/abs/1604.05700},
  note = {Source identifier: 1604.05700}
}