TY  - RPRT
TI  - An X-Band Waveguide Measurement Technique for the Accurate Characterization of Materials with Low Dielectric Loss Permittivity
AU  - Kenneth W. Allen
AU  - Mark M. Scott
AU  - David R. Reid
AU  - Jeffrey A. Bean
AU  - Jeremy D. Ellis
AU  - Andrew P. Morris
AU  - Jeramy M. Marsh
PY  - 2016
DO  - 10.1063/1.4948388
UR  - https://arxiv.org/abs/1604.05700
ID  - 1604.05700
ER  -