@misc{indiciaedbf81ac17b98,
  title = {Optical nano artifact metrics using silicon random nanostructures},
  author = {Tsutomu Matsumoto and Naoki Yoshida and Shumpei Nishio and Morihisa Hoga and Yasuyuki Ohyagi and Naoya Tate and Makoto Naruse},
  year = {2016},
  url = {https://arxiv.org/abs/1605.02120},
  note = {Source identifier: 1605.02120}
}