TY  - RPRT
TI  - Measurement of Laterally Induced Optical Forces at the Nanoscale
AU  - Fei Huang
AU  - Venkata Ananth Tamma
AU  - Hemanta Kumar Wickramasinghe
PY  - 2016
DO  - 10.1063/1.4975682
UR  - https://arxiv.org/abs/1605.03163
ID  - 1605.03163
ER  -