TY  - RPRT
TI  - Heat and charge current fluctuations and the time dependent coefficient of performance for a nanoscale refrigerator
AU  - Hiroki Okada
AU  - Yasuhiro Utsumi
PY  - 2017
DO  - 10.7566/jpsj.86.024007
UR  - https://arxiv.org/abs/1605.03809
ID  - 1605.03809
ER  -