@misc{indiciae53ba1a247ab6,
  title = {Defect engineering of the electronic transport through cuprous oxide interlayers},
  author = {Mohamed M. Fadlallah and Ulrich Eckern and Udo Schwingenschlögl},
  year = {2016},
  doi = {10.1038/srep27049},
  url = {https://arxiv.org/abs/1605.04171},
  note = {Source identifier: 1605.04171}
}