TY  - RPRT
TI  - Defect engineering of the electronic transport through cuprous oxide interlayers
AU  - Mohamed M. Fadlallah
AU  - Ulrich Eckern
AU  - Udo Schwingenschlögl
PY  - 2016
DO  - 10.1038/srep27049
UR  - https://arxiv.org/abs/1605.04171
ID  - 1605.04171
ER  -