@misc{indiciae0b515033f5ff,
  title = {Two competing interpretations of Kelvin Probe Force Microscopy on semiconductors put to test},
  author = {Leo Polak and Rinke J. Wijngaarden},
  year = {2016},
  doi = {10.1103/physrevb.93.195320},
  url = {https://arxiv.org/abs/1605.05539},
  note = {Source identifier: 1605.05539}
}