TY  - RPRT
TI  - Two competing interpretations of Kelvin Probe Force Microscopy on semiconductors put to test
AU  - Leo Polak
AU  - Rinke J. Wijngaarden
PY  - 2016
DO  - 10.1103/physrevb.93.195320
UR  - https://arxiv.org/abs/1605.05539
ID  - 1605.05539
ER  -