TY  - RPRT
TI  - Resistive Switching Phenomena of HfO2 Films Grown by MOCVD for Resistive Switching Memory Devices
AU  - Min Ju Yun
AU  - Sungho Kim
AU  - Hee-Dong Kim
PY  - 2016
UR  - https://arxiv.org/abs/1605.06014
ID  - 1605.06014
ER  -