TY  - RPRT
TI  - Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy
AU  - Hiroaki Ooe
AU  - Dominik Kirpal
AU  - Daniel S. Wastl
AU  - Alfred J. Weymouth
AU  - Toyoko Arai
AU  - Franz J. Giessibl
PY  - 2016
DO  - 10.1063/1.4964125
UR  - https://arxiv.org/abs/1605.06584
ID  - 1605.06584
ER  -