TY  - RPRT
TI  - Quantum metrology with a single spin-$3/2$ defect in silicon carbide
AU  - Ö. O. Soykal
AU  - T. L. Reinecke
PY  - 2016
DO  - 10.1103/physrevb.95.081405
UR  - https://arxiv.org/abs/1605.07628
ID  - 1605.07628
ER  -