@misc{indiciaed128c3456b0b,
  title = {Optical Characterization of PtSi/Si by Spectroscopic Ellipsometry},
  author = {Van Long Le and Tae Jung Kim and Han Gyeol Park and Hwa Seob Kim and Chang Hyun Yoo and Hyoung Uk Kim and Young Dong Kim and Junsoo Kim and Solyee Im and Won Chul Choi and Seung Eon Moon and Eun Soo Nam and},
  year = {2016},
  doi = {10.3938/jkps.69.291},
  url = {https://arxiv.org/abs/1606.03767},
  note = {Source identifier: 1606.03767}
}