TY  - RPRT
TI  - Thickness characterization of atomically-thin WSe$_2$ on epitaxial graphene by low-energy electron reflectivity oscillations
AU  - Sergio C. de la Barrera
AU  - Yu-Chuan Lin
AU  - Sarah M. Eichfeld
AU  - Joshua A. Robinson
AU  - Qin Gao
AU  - Michael Widom
AU  - Randall M. Feenstra
PY  - 2016
DO  - 10.1116/1.4954642
UR  - https://arxiv.org/abs/1606.04167
ID  - 1606.04167
ER  -