@misc{indiciae53c5720516f1,
  title = {Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering},
  author = {Kristof Moors and Bart Sorée and Wim Magnus},
  year = {2016},
  doi = {10.1016/j.mee.2016.10.015},
  url = {https://arxiv.org/abs/1606.05972},
  note = {Source identifier: 1606.05972}
}