TY  - RPRT
TI  - Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering
AU  - Kristof Moors
AU  - Bart Sorée
AU  - Wim Magnus
PY  - 2016
DO  - 10.1016/j.mee.2016.10.015
UR  - https://arxiv.org/abs/1606.05972
ID  - 1606.05972
ER  -