@misc{indiciae0376b99e6088,
  title = {Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications},
  author = {The EDELWEISS Collaboration and Q. Arnaud and E. Armengaud and C. Augier and A. Benoît and L. Bergé and J. Billard and J. Blümer and T. de Boissière and A. Broniatowski and P. Camus and A. Cazes and M. Chapellier and F. Charlieux and L. Dumoulin and K. Eitel and N. Foerster and N. Fourches and J. Gascon and A. Giuliani and M. Gros and L. Hehn and G. Heuermann and M. De Jésus and Y. Jin and A. Juillard and M. Kleifges and V. Kozlov and H. Kraus and C. Kéfélian and V. A. Kudryavtsev and H. Le-Sueur and S. Marnieros and X. -F. Navick and C. Nones and E. Olivieri and P. Pari and B. Paul and M. -C. Piro and D. Poda and E. Queguiner and S. Rozov and V. Sanglard and B. Schmidt and S. Scorza and B. Siebenborn and D. Tcherniakhovski and L. Vagneron and M. Weber and E. Yakushev},
  year = {2016},
  doi = {10.1088/1748-0221/11/10/p10008},
  url = {https://arxiv.org/abs/1606.08097},
  note = {Source identifier: 1606.08097}
}